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       进口粘度计 流变仪 质构仪-广州易测仪器有限公司 >> Cecil英国塞西尔 >> 反射率分光光度计 ReflectaScan>>

商品名称:反射率分光光度计ReflectaScan Spectrophotometer
 
 反射率分光光度计ReflectaScan Spectrophotometer
  商品编号: 20144272016
  商品规格: ReflectaScan Spectrophotometer
  商品品牌: Cecil
  商品比较:
  商品库存: 10台 热卖中
  商品折扣: 10折 ( 赠送积分0分 )
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市场价:
¥1.00元
会员价:
¥1.00 元
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用途:

测试固体、液体、粉体的颜色,色差;薄膜、镀膜的厚度,纸张或者织物荧光反射率等

应用:电子 化工 油墨 涂料 食品 啤酒 饮料 化妆品 调味品 薄膜 塑胶 建筑 教学等行业

Universal Reflectance Measurements

The ReflectaScan Reflectance Spectrophotometer is designed as a universal reflectance measuring instrument capable of scanning samples over the wavelength range 190-1,100nm. An integral printer plots results and an external dot matrix or colour inkjet printer may be used if required.
Diffuse Reflectance Measurements
The integrating sphere system allows a range of measurements to be made.
Diffuse and specular samples
Total hemispherical reflectance
Specular excluded diffuse reflectance
Transmittance of turbid or scattering samples
Diffuse reflectance of powder samples
Diffuse Reflectance
The compact integrating sphere, which mounts within the instrument's sample compartment, is made from SpectralonTM which has the highest reflectance over the UV and visible region of any known substance. This gives high energy throughput resulting in excellent performance. The design is versatile, easy to use and allows for the elimination of substitution errors.
A 0° sample rest enables measurements to be carried out with the specular component eliminated. Substituted by a 11° sample rest, total hemispherical reflectance is measured.
A dedicated high performance SpectralonTM integrating sphere is used for diffuse reflectance and diffuse transmittance measurements. The sphere unit has its own silicon diode detector which uses a separate signal channel within the Spectrophotometer.
Turbid or Scattering Samples
The sphere unit is equipped with a 10mm pathlength cuvette holder so that transmittance measurements may be made for both turbid or normal samples. Scattering films may also be accommodated for measurement.
Specular Reflectance
A dedicated specular reflectance unit is used for specular reflectance measurements of surfaces and coated opthalmic lenses. The unit is ideal for quality assurance in the production of anti-reflection coated opthalmic lenses, many of these systems are now in use around the world.

Diffuse Reflectance of Samples

A scan is shown here of a poppy coloured paint sample from the Dulux paint range and also an overlay of scans for two blue paint samples each specified by its British Standard number shown on the chart.

Below is the reflectance scan of a plain white copy paper which shows a good flat response over the visible region, with fluorescence stimulated by UV radiation showing in the short wavelength region, but the origin of which is of longer wavelength.

All scans were made with the specular component excluded.

Coated Lens Reflectance
The optical performance of the anti-reflection coatings on opthalmic lenses is specifically catered for by the specular reflectance unit. A conical rest is provided to accommodate lenses up to 80mm diameter. Measurements are made with reference to an uncoated lens and the system is excellent for the production control of vacuum coated lenses. Many of these systems are now in everyday use.
Opthalmic Lens Transmission
The transmission characteristics of tinted opthalmic lenses may readily be measured using the CE 3077 lens mounting system. This allows the lens to be accurately centred on a carrier plate which is kinematically mounted on the body of the lens holder.
Measurement of Thin Films
Using the CE 3075 specular reflectance unit, the thickness of films deposited on a surface, for instance a epitaxial film of silicon dioxide on a silicon wafer, is readily measured.
The reflectance scan of such a film against wavelength produces a series of transmission maxima and minima due to the interference between energy reflected from the front surface of the film and that reflected from the interface between the film and its substrate.
Film thickness is calculated from an equation relating the number of peaks to their wavelength separation. Alternatively, ColourScan software may be used for automatic calculations.  Films down to about 0.1 microns in thickness may be measured.
A scan of a deposited film is shown here, the film thickness was calculated to be 1.05 microns.
Software is available (ColourScan), to enable a wide range of automatic calculations including tristimulus values, chromaticity, CIE L* A* B, CIE L* U* V, Hunter, metric colour, whiteness and yellowness.
Standard illuminant tables include CIE, A, B & C and CIE D50, D65 & D75. Observer tables include 2° and 10° angles.
Shown here is part of a complete printout from a light blue paint sample produced by the colour software programme.
Automatic Colour Measurements 
DataStream software Specifications and Spectrophotometer Ordering

 

ReflectaScan Spectrophotometer
Each purchased Spectrophotometer is supplied complete with single cell holder, power cable, operators manual and short form instructions.
Specifications and Ordering of spectrophotometer and accessories
Optical Monochromator   Littrow using 1200 L/mm holographic grating  
Optical Bandwidth   4nm  
Wavelength Range and Accuracy   190-1100nm, better than ±1nm  
Wavelength Reproducibility   ±0.1nm  
Self Test and Calibration   Automatic at switch on  
Wavelength Scale Expansion   Selectable by keyboard entry 1-100nm/cm  
Scan Speed   Selectable by keyboard entry 1-4000nm/min  
Straylight   Typically <0.01% at 220nm and 340nm  
Display Screen - Backlit LCD   Displays menus, plots etc with six screen widths of viewing.  
Photometric Ranges   Digital display of -0.3-3A, 0-200%T, 0-9999C 
Photometric Accuracy   ±0.005A or 1% whichever is greater 
Photometric Noise   Less than ±0.0002A (500nm) 
Baseline Flatness   Better than ±0.002A most of range 
Baseline Stability   Better than 0.001A/hour, 500nm 
Overlayed Scans   Scans and derivatives with or without offset 
Spectral Reprocessing   Scans manipulated and replotted over any range 
Scan Storage   Up to 100 stored security code protected 
Curve Fitting and Editing   Linear, quadratic or cubic; up to 30 standards 
Cell and Wavelength Programming   Up to 8 cells and 10 wavelengths in any combination 
Method Storage   Up to 30 methods stored in safe memory 
Derivative Spectra   1st and 2nd derivatives 
Peak Seek   Automatic search programme, baseline corrected 
Time Course Plotting   Plots may be reprocessed and stored 
Real Time Clock   Timed and dated reports 
Computer/printer interfaces   Bi-directional serial RS232C and USB ports 
Size & Weight   480 x 340 x 205mm, 19kg, 
Power Requirements   110-250V, 50/60Hz, 170W 

 
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